Comprehensive characterization of 2D materials
We specialize in the comprehensive characterization of 2D materials and van der Waals heterostructures across their electrical, optical, mechanical, and magnetic properties. Using Atomic Force Microscopy (AFM), we conduct precise nano-mechanical analyses (e.g., suspended membrane strength, grain boundary friction) and investigate layer-dependent electronic properties, such as dielectric constants and work functions. By using power-, temperature-, and gate-dependent photoluminescence/electroluminescence spectroscopy, we observe complex excitonic dynamics and quantum confinement effects in tailored heterostructures. Additionally, we probe band structure variations and quantum transport phenomena under external electrostatic and high magnetic fields, while analyzing polarization-dependent anisotropy and intrinsic magnetic phase transitions. By elucidating these fundamental physical phenomena, our work paves the way for tailored applications in next-generation electronics, photonics, spintronics, and quantum computing.